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This paper presents a new FDTD-based optical simulation model dedicated todescribe the optical performances of CMOS image sensors taking into accountdiffraction effects. Following market trend and industrialization constraints,CMOS image sensors must be easily embedded into even smaller packages, whichare now equipped with auto-focus and short-term coming zoom system. Due tominiaturization, the ray-tracing models used to evaluate pixels opticalperformances are not accurate anymore to describe the light propagation insidethe sensor, because of diffraction effects. Thus we adopt a more fundamentaldescription to take into account these diffraction effects: we chose to useMaxwell-Boltzmann based modeling to compute the propagation of light, and touse a software with an FDTD-based (Finite Difference Time Domain) engine tosolve this propagation. We present in this article the complete methodology ofthis modeling: on one hand incoherent plane waves are propagated to approximatea product-use diffuse-like source, on the other hand we use periodic conditionsto limit the size of the simulated model and both memory and computation time.After having presented the correlation of the model with measurements we willillustrate its use in the case of the optimization of a 1.75$\mu$m pixel.

FDTD-based optical simulations methodology for CMOS image sensors pixels architecture and process optimization