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International audienceNear-field microscopy applications sometimes require scanning the sample over the millimetre range. This paper describes a home-made displacement system that can replace the limited range XY scanner of a classical near-field microscope. The system lays on a coarse/fine displacements configuration to attain the millimetre. Nanometre scale repeatability and resolution are met thanks to a control loop based on phase shifting techniques. The system was tested under an Atomic Force Microscope. The setup of the experiments and the results obtained are herein presented

Large area sample holder unit for enhanced near field microscopy applications