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We present initial results from our evaluation of a gold-contacted pixellateddetector using cadmium zinc telluride substrate produced by IMARAD ImagingSystems. The Horizontal Bridgman (HB) grown crystals from IMARAD have beenshown to produce high resolution photopeaks, but they are also seen to havelarge leakage current. Our previous tests with IMARAD CZT showed that the useof indium anodes and gold cathode improved the resistivity compared to thestandard indium-contacted detectors. We seek to test whether simple evaporatedgold contacts alone could also reduce the leakage current and thus improve thespectral resolution, especially in the 10-100 keV energy range. We havefabricated several metal-semiconductor-metal (MSM) detectors with a 4x4 arrayof pixels on 10x10 mm substrates. Measurements of the detectors' leakagecurrent, spectral response, and temperature sensitivity are presented andcompared to IMARAD's ohmic contact detector and gold contact MSM detectors madeof High Pressure Bridgman (HPB) material. Finally, we show preliminary resultsfrom a tiled flip-chip pixellated detector made using the IMARAD detectors.Comment: To appear in Proc. SPIE 4141, "Hard X-ray, Gamma-Ray, and Neutron  Detector Physics II

<title>Development of gold-contacted flip-chip detectors with IMARAD CZT</title>