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Photon counting imaging detectors (PCD) has paved the way for the emergence of Spectral X-ray Computed Tomography (SCT), which simultaneously measures a material’s linear attenuation coefficient (LAC) at multiple energies defined by the energy thresholds. In previous work SCT data was analysed with the SIMCAD method for material classifications. The method measures system-independent material properties such as electron density, ρe and effective atomic number, Zeff to identify materials in security applications. The method employs a spectral correction algorithm that reduce the primary spectral distortions from the raw data that arise from the detector response: charge sharing and weighting potential cross-talk, fluorescence radiation, scattering radiation, pulse pile up and incomplete charge collection. In this work, using real experimental data we analyze the influence of the spectral correction on material classification performance in security applications. We use a vectorial total variation (L∞-VTV) as a convex regularizer for image reconstruction of the spectral sinogram. This reconstruction algorithm employs a L∞ norm to penalize the violation of the inter energy bin dependency, resulting in strong coupling among energy bins. Due to the strong inter-bin correlation, L∞-VTV leads to noticeably better performance compared to bin-by-bin reconstructions including SIRT and total variation (TV) reconstruction algorithms. The image quality was evaluated with the correlation coefficient that is computed relative to ground-truth images. A positive weighting parameter defines the strength of the L∞-VTV regularization term and thus controls the trade-off between a good match to spectral sinogram data and a smooth reconstruction in both the spatial and spectral dimension. The classification accuracy both for raw and corrected data is analyzed over a set of weighting parameters. For material classification, we used 20 different materials for calibrating the SIMCAD method and 15 additional materials in the range of 6 ≤ Zeff ≤ 15 for evaluating the classification performance. We show that the correction algorithm accurately reconstructs the measured attenuation curve, and thus gives higher detection rates. We show that using the spectral correction leads to an accuracy increase of 1.6 and 3.8 times in estimating ρe and Zeff, respectively

The significance of the spectral correction of photon counting detector response in material classification from spectral x-ray CT