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Metal-dielectric light absorbers are of great interest for suppressing stray light in optical systems. Such coatings can give an absorption level greater than 99.9% over a broad spectral range provided that the complex refractive index of metallic films is accurately known. For this purpose we developed a new real-time monitoring system that allows to measure in situ both reflectance and transmittance of the coating during manufacturing in the deposition chamber. This paper describes the system design and its characteristics and gives some preliminary results concerning metallic thin film characterizations.

Development of a real-time reflectance and transmittance monitoring system for the manufacturing of metaldielectric light absorbers