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The Gaia payload ensures maximum passive stability using a single material,SiC, for most of its elements. Dedicated metrology instruments are, however,required to carry out two functions: monitoring the basic angle and refocusingthe telescope. Two interferometers fed by the same laser are used to measurethe basic angle changes at the level of $\mu$as (prad, micropixel), which isthe highest level ever achieved in space. Two Shack-Hartmann wavefront sensors,combined with an ad-hoc analysis of the scientific data are used to define andreach the overall best-focus. In this contribution, the systems, data analysis,procedures and performance achieved during commissioning are presented

Gaia on-board metrology: basic angle and best focus