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We use scanning near field optical microscopy  SNOM  to characterize different plasmonic nanoparticle situations with high spatial and spectral resolution in this comparative study. The near field enhancement is measured with an aperture probe  Al coated glass fiber  and two CCD spectrometers for simultaneous detection of reflection and transmission. The images of transmission and reflection show a correlation to the topography. We present a new way to access the relative absorption and discuss the results with consideration of artifact influences. Near field enhancements are deeper understood by imaging isolated particles. This near field will be compared to measurements of random particle distributions. Therefore, we will show normalized reflection and transmission images of random structures that lay the foundation for an absolute interpretation of near field images. The normalization considers both the far field UV VIS results and a reference image of the substrate. The near field reflection of nanoparticle arrays shows an enhancement of 25  . In view of specific applications, particle distributions implemented in two ways  as far field scatters and as near field enhancing object

Comparative scanning near-field optical microscopy studies of plasmonic nanoparticle concepts