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The VIS instrument on board the Euclid mission is a weak-lensing experimentthat depends on very precise shape measurements of distant galaxies obtained bya large CCD array. Due to the harsh radiative environment outside the Earth'satmosphere, it is anticipated that the CCDs over the mission lifetime will bedegraded to an extent that these measurements will only be possible through thecorrection of radiation damage effects. We have therefore created a Monte Carlomodel that simulates the physical processes taking place when transferringsignal through a radiation-damaged CCD. The software is based onShockley-Read-Hall theory, and is made to mimic the physical properties in theCCD as closely as possible. The code runs on a single electrode level and takesthree dimensional trap position, potential structure of the pixel, andmulti-level clocking into account. A key element of the model is that it alsotakes device specific simulations of electron density as a direct input,thereby avoiding to make any analytical assumptions about the size and densityof the charge cloud. This paper illustrates how test data and simulated datacan be compared in order to further our understanding of the positions andproperties of the individual radiation-induced traps.

Comparing simulations and test data of a radiation damaged charge-couple device for the Euclid mission