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V2O5 xerogel films were fabricated by casting V2O5 sols onto fluorine-doped tin oxide glass substrates at room temperature. Five, ten and twenty atomic layers of Al2O3 were grown onto as-fabricated films respectively. The bare film and Al2O3-deposited films all exhibited hydrous V2O5 phase only. Electrochemical impedance spectroscopy study revealed increased surface charge-transfer resistance of V2O5 films as more Al2O3 atomic layers were deposited. Lithium-ion intercalation tests at 600 mAg−1 showed that bare V2O5 xerogel film possessed high initial discharge capacity of 219 mAhg−1 but suffered from severe capacity degradation, i.e., having only 136 mAhg−1 after 50 cycles. After deposition of ten atomic layers of Al2O3, the initial discharge capacity was 195 mAhg−1 but increased over cycles before stabilizing; after 50 cycles, the discharge capacity was as high as 225 mAhg−1. The noticeably improved cyclic stability of Al2O3-deposited V2O5 xerogel film could be attributed to the improved surface chemistr...

Atomic layer deposition of Al2O3 on V2O5 xerogel film for enhanced lithium-ion intercalation stability