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Named after Prof. E.J. McCluskey, a key contributor to the field of test technology, the 2013 TTTC's Doctoral Thesis Award serves the purpose to promote most impactful doctoral student work, to provide the students with the exposure to the community and the prospective employers, and to support interaction between academia and industry in the field of test technology. TTTC's E.J. McCluskey Best Doctoral Thesis Award will be given to the winning student of the doctoral student contest and his or her advisor. The award consists of a certificate, an honorarium and an invitation to submit a paper on the presented work to the IEEE Design &amp; Test magazine.

Special session 8A: McCluskey Doctoral Thesis Award semi-final — presentations