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We present a line-based model of transverse domain walls in thin magnetic strips, to study the effect of bulk disorder on the domain wall dynamics within the thermally activated creep regime. The creep velocity is found to exhibit a nonlinear dependence on both applied magnetic fields and electric currents, characterized by similar creep exponents for both forms of the external drive. We discuss briefly the significance of the inherently stochastic thermally activated domain wall motion from the point of view of spintronics applications, where it generally is essential to be able to control the domain wall displacement in a deterministic manner.

Modeling Domain Wall Dynamics in Thin Magnetic Strips With Disorder