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Graphene field-effect transistors (GFETs) exhibit negligible transconductance under two scenarios: for any gate-to-source voltage when the drain-to-source voltage is set to zero and for an arbitrary drain-to-source voltage provided that the gate-to-source voltage equals the Dirac voltage. Hence, extracting the channel and the parasitic series resistances from    ${S}$   -parameters under these conditions enables analyzing their dependence on the gate and drain biases. This is fundamental to assess the portion of the output resistance that is controlled by the gate. Besides, the drain bias dependence of the drain and source resistances is also evidenced. Within the proposal, resistive components accounting for the lossy nature of the gate capacitance are incorporated into the model, which exhibits a broadband correlation with experimental data. This avoids the series resistances to be considered as frequency dependent in the model.

Characterization of the Intrinsic and Extrinsic Resistances of a Microwave Graphene FET Under Zero Transconductance Conditions