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TDCs formed by ring oscillators are arrayable, scalable, and low power, making them suitable for SPAD-based TCSPC 3D imaging systems. The TDC precision affects the ranging accuracy and, hence, the quality of the reconstructed 3D image. This brief studies the jitter of ring-oscillator-based TDCs as a function of their full-scale-range and derives an expression for the TDC total jitter. The introduced behavioral model describes three different regions of the SNR for TDCs. A peak-SNR design-point is identified. Increasing the full-scale-range of the TDC beyond this point entails increased jitter and, thus, ultimately a declining SNR. The analysis is validated using post-layout simulations of a ring-oscillator-based TDC designed in 65nm CMOS. A TDC resolution degradation factor defines the TDC jitter behavioral model. It is consistent with FOMs that have been used in the past to evaluate TDCs and clarifies their underlying assumptions.

Peak-SNR Analysis of CMOS TDCs for SPAD-Based TCSPC 3D Imaging Applications