English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

This paper presents a method of creating a true/complement pattern set of optimal size that satisfies simultaneous switching limit constraints. This method is an improvement over previous methods in that it has better runtime characteristics as well as the ability to handle additional scenarios. It can produce safe initial vectors, produce vectors that consider switching limits by device rather than globally, and reduce (or eliminate) the number of morph vectors required.

Interconnect Test Pattern Generation Algorithm For Meeting Device and Global SSO Limits With Safe Initial Vectors