English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

The reliable operation of an integrated circuit can be affected by environmental changes, such as of multiple frequency electromagnetic (EM) disturbances and temperature variations. This paper compares the performance of two oscillator circuits, namely a current-starved voltage controlled oscillator and a ring oscillator integrated into a chip, in terms of their immunity to multitone direct power injection while under the influence of thermal stress. The objective is to demonstrate by the means of measurements the synergistic effect caused by multitone EM disturbances in a test chip, in contrast to the conventional single-tone EM disturbances. Moreover, the multitone immunity levels of integrated blocks with different architectures but similar functionality are analyzed at extreme temperature deviations. Bayesian networks (BN) are applied in order to visualize the probability of circuit failure due to multitone disturbances and temperature influence. Additionally, noisy-OR and improved-adaptive-recursive-noisy-OR (I-ARNOR) probabilistic models are implemented to identify the types of causal interactions (i.e. inhibition and positive causality) between multitone disturbances and to predict the probability of failure due to higher order multitone disturbances, respectively.

Experimental Characterization of Multitone EM Immunity of Integrated Oscillators Under Thermal Stress