English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Plus monthly

Global: Zendy Tools annual

Global: Zendy Tools monthly

Global: Zendy Free Plan

The introduction of fully electric vehicles (FEVs) into the mainstream has raised concerns about the reliability of their electronic components such as Insulated Gate Bipolar Translator (IGBT). At present, only the transient thermal resistance curve in the datasheet and the initial thermal model of the experimental test are used to evaluate the life of the IGBT module, while it is well known that IGBT parameters are affected by its degree of aging. Thus, the development of research for the aging process of IGBT is of key importance. The aging process of IGBT is proposed to be a gradual aging process, verified by the accelerated aging experiment. Firstly, the mechanism between the relevant aging parameters and the degree of IGBT aging is studied in this paper. Secondly, the switching parameters in different degrees of aging are measured and compared by accelerated experiments. Finally, the stepwise linear regression algorithm is used to screen parameters and the Mann-Kendall test method is used to analyze the IGBT aging process curve. The results show that the aging process of IGBT is gradual, and the aging process model of IGBT is finally established. On this basis, the remaining using life of IGBT can be accurately measured.

Research on the Gate Oxide Layer Aging Trend of Power Electronic Device