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The non-linear microwave surface impedance, Z/sub s/=R/sub s/+iX/sub s/, of patterned YBCO thin films, was measured using a suspended line resonator in the presence of a perpendicular DC magnetic field, H/sub DC/, of magnitude comparable to that of the microwave field, H/sub rf/. Signature of the virgin state was found to be absent even for relatively low microwave power levels. The microwave loss was initially found to decrease for small applied H/sub DC/ before increasing again. Also, non-linearities inherent in the sample were found to be substantially suppressed at low powers at these applied fields. These two features together can lead to significant improvement in device performance.

Nonlinear response of HTSC thin film microwave resonators in an applied DC magnetic field