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A new method of processing and analysing electron diffraction patterns is presented that may have numerous analogues in other areas. It is demonstrated here in quantitative convergent beam electron diffraction (QCBED), for very precise measurements of structure factors. The technique maximises the sensitivity of structure factor measurement from diffraction data by almost completely eliminating the diffuse background contributed by inelastic scattering processes, most notably, thermal diffuse scattering (TDS). This is demonstrated in fig. 1. The present work is an extension to [1] and covers both energy-filtered and unfiltered CBED. [1] P.N.H. Nakashima, Phys. Rev. Lett. 99 (2007), 125506. [2] Thanks to A. Prof. J. Etheridge, Prof. A. Moodie, A. Prof. A. Johnson, Dr. V. Streltsov, the Australian Research Council (DP0346828) and the Australian and Victorian Partnerships for Advanced Computing. F i g . 1 : Tw o z e r o l o s s filtered CBED patterns (6eV sl i t width) from different thicknesses of corundum. The background (outside the discs) in both patterns still contains significant signal due to inelastic scattering (mostly TDS), which is almost completely canceled in the difference pattern.

Determination of order parameter of single L10-FePd nanoparticle by nanobeam electron diffraction

Determination of order parameter of single L1₀-FePd nanoparticle by nanobeam electron diffraction