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C487 shapes and lattice defects were evaluated from the X-ray pattern. In those cases the determined quantities are characteristic to a large volume of sample. In the present case the X-ray diffraction technique was employed for characterization of individual nano-belts. The measurements of Xray diffraction lines from a single nano-belt were achieved by using the unique nano-diffraction technique described in [2]. The results were compared with those obtained from SEM/TEM.

Strain, size and composition of buried GaN quantum dots in AlN using grazing incidence anomalous diffraction