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By exploiting the preferred orientation of the crystallites in a textured polycrystalline sample, the individual intensities of reflections that overlap in 2θ can be estimated more reliably and more single-crystal-like data obtained for structure solution. The viability of this approach has been demonstrated for data collected in reflection mode, but 3 days of synchrotron beamtime are required per sample. In an attempt to reduce the data collection time, to reduce the size of the sample and to obtain more complete data, experiments in transmission mode using a 2-dimensional detector have been performed. Typically 36 image plate frames, each corresponding to a 5° rotation of the sample, are measured. Each of these frames is subsequently divided into 72 radial wedges (5° sample tilt) using the program Fit2d. Thus the dataset consists of 36x72=2592 powder diffraction patterns, each corresponding to a different sample orientation. To analyze this large amount of data, the program Expol has been reorganized and expanded. In the first step of data analysis, an automatic intensity extraction procedure based on the Pawley algorithm is used to obtain pole figure data (intensity change as a function of sample orientation) for non-overlapping reflections. These data are then used to determine the orientation of the crystallites for the subsequent extraction of a single set of reflection intensities from the full dataset.

EXPOL: data analysis software for extracting more single-crystal-like intensities from data collected on a textured sample