English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

X-RAY STANDING WAVE MICROSCOPY PERMITS CHEMICAL MICROANALYSIS WITH ATOMIC RESOLUTION M. Drakopoulos J. Zegenhagen 1 A. Snigirev I. Snigireva K. Eberl V.V. Aristov L. Shabelnikov V. Yunkin European Synchrotron Radiation Facility, B.P. 220, 38043 Grenoble, France Max-Planck-Institute for Solid Sate Research, Heisenbergstrasse 1, 70569 Stuttgart, Germany Institute for Microelectronics Technology RAS, 142432 Chernogolovka, Russia

X-ray standing wave microscopy permits chemical microanalysis with atomic resolution