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We recently used synchrotron x-ray diffraction combined with raman scattering to study pressure-induced amorphisation in silicon compressed to above 10-15 gpa. The high pressure amorphous form was in a high-density state. During decompression, a transformation occurred to the normal tetrahedrally coordinated amorphous semiconductor form. We suggest that the amorphous-amorphous transition is linked to an underlying phase transition in the liquid state. We now have evidence for further 'polyamorphism' in amorphous silicon, between 'continuous random network' and 'clathrate cagelike' amorphous tetrahedral states. Structural information including x-ray diffraction, nmr and vibrational spectroscopy, will be presented, along with a possible 'metastable phase diagram' including the amorphous silicon states.

Structural transitions in amorphous silicon at high and low density