English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

A novel technique using single-slit x-ray Fresnel diffraction has been developed to resolve μm-order electron beam sizes at the insertion devices (IDs) of photon beam lines. The new technique is promising for diagnostics of next-generation light sources, where a tuning of ultralow emittance at insertion devices is essentially important to ensure the absence of the degradation of brilliance and the transverse coherence of radiation at beam lines due to distortion of lattice functions. The validity of the method was experimentally studied at SPring-8, and the achievable resolution is discussed

X-ray Fresnel diffractometry for ultralow emittance diagnostics of next generation synchrotron light sources