English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

We report on the correlation between the boson-peak and structural changesassociated with thermally-treating amorphous indium-oxide films. In thisprocess, the resistance of a given sample may decrease by a considerable marginwhile its amorphous structure is preserved. In the present study, we focus onthe changes that result from the heat-treatment by employingelectron-microscopy, X-ray, and Raman spectroscopy. These techniques were usedon films with different stoichiometry and thus different carrier-concentration.The main effect of heat-treatment is material densification, which presumablyresults from elimination of micro-voids. The densified system presents betterwavefunction-overlap and more efficient connectivity for the current flow.X-ray, and electron-beam diffraction experiments indicate that the heat-treatedsamples show significantly less spatial heterogeneity with only a moderatechange of the radial-distribution function metrics. These results areconsistent with the changes that occur in the boson-peak characteristics due toannealing as observed in their Raman spectra.

Microstructure and the Boson-peak in thermally-treated In_{x}O films