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R. Held,1 T. Mairoser,2 A. Melville,1 J. A. Mundy,3 M. E. Holtz,3 D. Hodash ,1 Z. Wang,1 J. T. Heron,1 S. T. Dacek ,1 B. Holländer,4 D. A. Muller,3,5 and D. G. Schlom 1,5,6 1Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853, USA 2Zentrum für Elektronische Korrelationen und Magnetismus, Universität Augsburg, Universitätsstraße 1, D-86159 Augsburg, Germany 3School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853, USA 4Peter Grünberg Institut, Forschungszentrum Jülich, D-52425 Jülich, Germany 5Kavli Institute at Cornell for Nanoscale Science, Ithaca, New York 14853, USA 6Leibniz-Institut für Kristallzüchtung, Max-Born-Str. 2, 12489 Berlin, Germany

Exploring the intrinsic limit of the charge-carrier-induced increase of the Curie temperature of Lu- and La-doped EuO thin films