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Lattice defects play a key role in determining the properties of crystallinematerials. Probing the 3D lattice strains that govern their interactionsremains a challenge. Bragg Coherent Diffraction Imaging (BCDI) allows strain tobe measured with nano-scale 3D resolution. However, it is currently limited tomaterials that form micro-crystals. Here we introduce a new technique thatallows the manufacture of BCDI samples from bulk materials. Using tungsten asan example, we show that focussed ion beam (FIB) machining can be used toextract, from macroscopic crystals, micron-sized BCDI samples containingspecific pre-selected defects. To interpret the experimental data, we develop anew displacement-gradient-based analysis for multi-reflection BCDI. This allowsaccurate recovery of the full lattice strain tensor from samples containingmultiple dislocations. These new capabilities open the door to BCDI as amicroscopy tool for studying complex real-world materials.

Nano-scale imaging of the full strain tensor of specific dislocations extracted from a bulk sample