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Activator impurities and their distribution in the host lattice play a keyrole in scintillation phenomena. Here a combination of cross-sectionalnoncontact atomic force microscopy (nc-AFM), X-ray photoelectron spectroscopy(XPS) and density functional theory (DFT) was used to study the distribution ofEu2+ dopants in a NaI scintillator activated by 3% of EuI2. Two types ofprecipitate structures were found. First, needle-shaped EuI2 precipitates witha layered structure are likely responsible for scattering the scintillationlight. In transparent crystals with good scintillation properties, precipitateswith a cubic crystal structure and a size below 4 nm were found. A surprisinglylow concentration of point defects was detected in all of the investigatedsamples. Upon annealing, Eu segregates towards the surface, which results inthe formation of an ordered hexagonal overlayer with the EuI2 composition and apronounced, unidirectional moire pattern.

Defect chemistry of Eu dopants in NaI scintillators studied by atomically resolved force microscopy