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The authors gratefully acknowledge the financial support of the Spanish Ministry of Economy and Competitiveness (MINECO) through Projects MAT2014-59187-R, MAT2015-66443-C02 1-R and CTQ2016-75880-P. A.R.-R. and E.R. are indebted to MINECO for a FPI (BES-2013-062620) and Ramon y Cajal (RYC-2011-08069) contracts, respectively. This research used resources of the Advanced Light Source, which is a DOE Office of Science User Facility under contract no. DEAC02- 05CH11231

Resonant soft x-ray scattering unravels the hierarchical morphology of nanostructured bulk heterojunction photovoltaic thin films