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We acknowledge financial support from Spanish Ministry of Economy and Competitiveness through the “Severo Ochoa” Programme for Centres of Excellence in R&D (SEV-2015-0496), CONSOLIDER Excellence Network (MAT2015-68994-REDC), COACHSUPENERGY project (MAT2014-51778-C2-1-R and BES-2015-072749 grant for B.M, co-financed by the European Regional Development Fund) and from the Catalan Government with 2017 SGR 1519 and Xarmae. J.J. acknowledges an FPU grant (FPU14/05960) from Ministerio espanol de Educacion, Cultura y Deporte para la Formacion de Profesorado Universitario and J.G. acknowledges the Ramon y Cajal program (RyC-2012–11709). The STEM microscopy work was conducted in the ICTS-CNME at UCM as well as at the Laboratorio de Microscopias Avanzadas (LMA) at Instituto de Nanociencia de Aragon (INA) at the University of Zaragoza. Authors acknowledge the ICTS-CNME for offering access to their instruments and expertise. Electron microscopy performed at the Centro Nacional de Microscopia Electronica (UCM) were sponsored by the ERC Starting Investigator Award No. STEMOX#239739.

physical review materials

Defect landscape and electrical properties in solution-derived <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mrow><mml:mi>LaNi</mml:mi><mml:msub><mml:mi mathvariant="normal">O</mml:mi><mml:mn>3</mml:mn></mml:msub></mml:mrow></mml:math> and <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mrow><mml:mi>NdNi</mml:mi><mml:msub><mml:mi mathvariant="normal">O</mml:mi><mml:mn>3</mml:mn></mml:msub></mml:mrow></mml:math> epitaxial thin films

Defect landscape and electrical properties in solution-derived LaNiO3 and NdNiO3 epitaxial thin films