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We investigate the microscopic mechanism responsible for the change of macroscopic electrical properties of the Bi2Sr2CaCu2O8+δ high-temperature superconductor induced by intense synchrotron hard X-ray beams. The possible effects of secondary electrons on the oxygen content via the knockon interaction are studied by Monte Carlo simulations. The change in the oxygen content expected from the knock-on model is computed convoluting the fluence of photogenerated electrons in the material with the Seitz-Koehler cross section. This approach has been adopted to analyze several experimental irradiation sessions with increasing X-ray fluences. A close comparison between the expected variations in oxygen content and the experimental results allows determining the irradiation regime in which the knock-on mechanism can satisfactorily explain the observed changes. Finally, we estimate the threshold displacement energy of loosely-bound oxygen atoms in this material Td =0.15−0.01 +0.025 eV.

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Monte Carlo analysis of the oxygen knock-on effects induced by synchrotron x-ray radiation in the <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mrow><mml:mi mathvariant="normal">B</mml:mi><mml:msub><mml:mi mathvariant="normal">i</mml:mi><mml:mn>2</mml:mn></mml:msub><mml:mi mathvariant="normal">S</mml:mi><mml:msub><mml:mi mathvariant="normal">r</mml:mi><mml:mn>2</mml:mn></mml:msub><mml:mi>CaC</mml:mi><mml:msub><mml:mi mathvariant="normal">u</mml:mi><mml:mn>2</mml:mn></mml:msub><…

Monte Carlo analysis of the oxygen knock-on effects induced by synchrotron x-ray radiation in the Bi2Sr2CaCu2<…