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We present an experimental investigation on the scaling of resistance inindividual single walled carbon nanotube devices with channel lengths that varyfour orders of magnitude on the same sample. The electron mean free path isobtained from the linear scaling of resistance with length at varioustemperatures. The low temperature mean free path is determined by impurityscattering, while at high temperature the mean free path decreases withincreasing temperature, indicating that it is limited by electron-phononscattering. An unusually long mean free path at room temperature has beenexperimentally confirmed. Exponentially increasing resistance with length atextremely long length scales suggests anomalous localization effects.

Scaling of Resistance and Electron Mean Free Path of Single-Walled Carbon Nanotubes