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Studies of low-frequency resistance noise show that the glassy freezing ofthe two-dimensional (2D) electron system in the vicinity of the metal-insulatortransition occurs in all Si inversion layers. The size of the metallic glassphase, which separates the 2D metal and the (glassy) insulator, dependsstrongly on disorder, becoming extremely small in high-mobility samples. Thebehavior of the second spectrum, an important fourth-order noise statistic,indicates the presence of long-range correlations between fluctuators in theglassy phase, consistent with the hierarchical picture of glassy dynamics.Comment: revtex4; 4+ pages, 5 figure

Universal Behavior of the Resistance Noise across the Metal-Insulator Transition in Silicon Inversion Layers