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We present results from the SPring-8 Angstrom Compact free electron LAser(SACLA) XFEL facility, using a high intensity ($\sim\!10^{20}\,$W/cm$^2$) X-raypump X-ray probe scheme to observe changes in the ionic structure of siliconinduced by X-ray heating of the electrons. By avoiding Laue spots in thescattering signal from a single crystalline sample, we observe a rapid rise indiffuse scattering, which we attribute to a loss of lattice order and atransition to a liquid state within 100 fs of irradiation, a timescale whichagrees well with first principles simulations, but is faster than thatpredicted by purely inertial behavior. This method is capable of observingliquid scattering without masking or filtering of signal from the ambientsolid, allowing the liquid structure to be measured throughout and beyond thephase change.

Using Diffuse Scattering to Observe X-Ray-Driven Nonthermal Melting