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We performed x-ray magnetic circular dichroism (XMCD) measurements onheterostructures comprising topological insulators (TIs) of the(Bi,Sb)$_2$(Se,Te)$_3$ family and the magnetic insulator EuS. XMCD measurementsallow us to investigate element-selective magnetic proximity effects at thevery TI/EuS interface. A systematic analysis reveals that there is neithersignificant induced magnetism within the TI nor an enhancement of the Eumagnetic moment at such interface. The induced magnetic moments in Bi, Sb, Te,and Se sites are lower than the estimated detection limit of the XMCDmeasurements of $\sim\!10^{-3}$ $\mu_\mathrm{B}$/at.

Absence of magnetic-proximity effect at the interface of Bi$_2$Se$_3$ and (Bi,Sb)$_2$Te$_3$ with EuS