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The standard entanglement test using the Clauser-Horne-Shimony-Holtinequality is known to fail in mesoscopic junctions at finite temperatures.Since this is due to the bidirectional particle flow, a similar failure isexpected to occur in an ac-driven contact. We develop a continuous-variableentanglement test suitable for electrons and holes that are created by the acdrive. The generalized Bell inequality is violated in junctions with lowconductance or small number of transport channels and with ac voltages whichcreate few electron-hole pairs per cycle. Our ac-entanglement test depends onthe total number of electron-hole pairs and on the distribution ofprobabilities of pair creations similar to the Fano factor.

Continuous-Variable Entanglement Test in Driven Quantum Contacts