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Chirality in condensed matter is now a topic of the utmost importance becauseof its significant role in the understanding and mastering of a large varietyof new fundamental physicals mechanisms. Versatile experimental approaches,capable to reveal easily the exact winding of order parameters are thereforeessential. Here we report X-ray resonant magnetic scattering (XRMS) as astraightforward tool to identify directly the properties of chiral magneticsystems. We show that it can straight-forwardly and unambiguously determine themain characteristics of chiral magnetic distributions: i.e. its chiral nature,the quantitative winding sense (clockwise or counter-clockwise) and its type(N\'eel/cycloidal or Bloch/helical). This method is model-independent, does notrequire a-priori knowledge of magnetic parameters and can be applied to anysystem with magnetic domains ranging from few nanometers (wavelength limited)to several microns. By using prototypical multilayers with tailored magneticchiralities based on the Co|Pt interface we illustrate the strength of thismethod.

Chirality in magnetic multilayers probed by the symmetry and the amplitude of dichroism in X-ray resonant magnetic scattering