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We present the results of an experiment where a short focal length (~ 1.3 cm)permanent magnet electron lens is used to image micron-size features of a metalsample in a single shot, using an ultra- high brightness ps-long 4 MeV electronbeam from a radiofrequency photoinjector. Magnifcation ratios in excess of 30xwere obtained using a triplet of compact, small gap (3.5 mm), Halbach-stylepermanent magnet quadrupoles with nearly 600 T/m field gradients. These resultspave the way to- wards single shot time-resolved electron microscopy and opennew opportunities in the applications of high brightness electron beams.

Demonstration of single-shot picosecond time-resolved MeV electron imaging using a compact permanent magnet quadrupole based lens