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We probe the indistinguishability of photons emitted by a semiconductorquantum dot (QD) via time- and temperature- dependent two-photon interference(TPI) experiments. An increase in temporal-separation between consecutivephoton emission events, reveals a decrease in TPI visibility on a nanosecondtimescale, theoretically described by a non-Markovian noise process inagreement with fluctuating charge-traps in the QD's vicinity. Phonon-inducedpure dephasing results in a decrease in TPI visibility from $(96\pm4)\,$\% at10\,K to a vanishing visibility at 40\,K. In contrast to Michelson-typemeasurements, our experiments provide direct access to the time-dependentcoherence of a quantum emitter at a nanosecond timescale.

Exploring Dephasing of a Solid-State Quantum Emitter via Time- and Temperature- Dependent Hong-Ou-Mandel Experiments