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Magneto-transport properties have been investigated for epitaxial thin filmsof B20-type MnSi grown on Si(111) substrates. Both Lorentz transmissionelectron microscopy (TEM) images and topological Hall effect (THE) clearlypoint to the robust formation of skyrmions over a wide temperature-magneticfield region. New features distinct from those of bulk MnSi are observed forepitaxial MnSi films: a shorter (nearly half) period of the spin helix andskyrmions, and an opposite sign of THE. These observations suggest versatilefeatures of skyrmion-induced THE beyond the current understanding.

Robust formation of skyrmions and topological Hall effect in epitaxial thin films of MnSi