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Using multiscaling analysis, we compare the characteristic roughening offerroelectric domain walls in PZT thin films with numerical simulations ofweakly pinned one-dimensional interfaces. Although at length scales up to alength scale greater or equal to 5 microns the ferroelectric domain wallsbehave similarly to the numerical interfaces, showing a simple mono-affinescaling (with a well-defined roughness exponent), we demonstrate more complexscaling at higher length scales, making the walls globally multi-affine(varying roughness exponent at different observation length scales). Thedominant contributions to this multi-affine scaling appear to be very localizedvariations in the disorder potential, possibly related to dislocation defectspresent in the substrate.

Multiscaling analysis of ferroelectric domain wall roughness