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The magnetic microstructure and domain wall distribution of antiferromagnetic$\alpha$-Fe$_2$O$_3$ epitaxial layers is determined by statistical imageanalyses. Using dichroic spectro-microscopy images, we demonstrate that thedomain structure is statistically invariant with thickness and that theantiferromagnetic domain structure of the thin films is inherited from theferrimagnetic precursor layer one, even after complete transformation intoantiferromagnetic $\alpha$-Fe$_2$O$_3$. We show that modifying the magneticdomain structure of the precursor layer is a genuine way to tune the magneticdomain structure and domain walls of the antiferromagnetic layers.

physical review letters

Origin and tailoring of the antiferromagnetic domain structure in  $\alpha$-Fe$_2$O$_3$ thin films unraveled by statistical analysis of dichroic  spectro-microscopy (X-PEEM) images