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The conducting interface of LaAlO$_3$/SrTiO$_3$ heterostructures has beenstudied by hard X-ray photoelectron spectroscopy. From the Ti~2$p$ signal andits angle-dependence we derive that the thickness of the electron gas is muchsmaller than the probing depth of 4 nm and that the carrier densities vary withincreasing number of LaAlO$_3$ overlayers. Our results point to an electronicreconstruction in the LaAlO$_3$ overlayer as the driving mechanism for theconducting interface and corroborate the recent interpretation of thesuperconducting ground state as being of the Berezinskii-Kosterlitz-Thoulesstype.

Profiling the interface electron gas of LaAlO3/SrTiO3 heterostructures by hard X-ray photoelectron spectroscopy