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We report on the measurement of detailed balance violation in a coupled,noise-driven linear electronic circuit consisting of two nominally identical RCelements that are coupled via a variable capacitance. The state variables arethe time-dependent voltages across each of the two primary capacitors, and thesystem is driven by independent noise sources in series with each of theresistances. From the recorded time histories of these two voltages, wequantify violations of detailed balance by three methods: 1) explicitconstruction of the probability current density, 2) by constructing thetime-dependent stochastic area, and 3) by constructing statistical fluctuationloops. In comparing the three methods, we find that the stochastic area isrelatively simple to implement, computationally inexpensive, and provides ahighly sensitive means for detecting violations of detailed balance.

Experimental metrics for detection of detailed balance violation