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Structure and dynamics at soft-matter interfaces play an important role innature and technical applications. Optical single-molecule investigations arenon-invasive and capable to reveal heterogeneities at the nanoscale. In thiswork we develop an autocorrelation function (ACF) approach to retrieve tracerdiffusion parameters obtained from fluorescence correlation spectroscopy (FCS)experiments in thin liquid films at reflecting substrates. This approach thenis used to investigate structure and dynamics in 100 nm thick 8CB liquidcrystal films on silicon wafers with five different oxide thicknesses. We finda different extension of the structural reorientation of 8CB at thesolid-liquid interface for thin and for thick oxide. For the thin oxides, theperylenediimide tracer diffusion dynamics in general agrees with thehydrodynamic modeling using no-slip boundary conditions with only a smalldeviation close to the substrate, while a considerably stronger decrease of theinterfacial tracer diffusion is found for the thick oxides.

physical review. e

Fluorescence correlation spectroscopy in thin films at reflecting  substrates as a means to study nanoscale structure and dynamics at  soft-matter interfaces