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Coherent diffraction imaging (CDI) of single molecules at atomic resolutionis a major goal for the x-ray free electron lasers (XFELs). However, during animaging pulse, the fast laser-induced ionization may strongly affect therecorded diffraction pattern of the irradiated sample. The radiation toleranceof the imaged molecule should then be investigated 'a priori' with a dedicatedsimulation tool. The continuum approach is a powerful tool for modeling theevolution of irradiated large systems consisting of more than a few hundredthousand atoms. However, this method follows the evolution of averagesingle-particle densities, and the experimentally recorded intensities reflectthe spatial two-particle correlations. The information on these correlations isthen inherently not accessible within the continuum approach. In this paper weanalyze this limitation of continuum models and discuss the applicability ofcontinuum models for imaging studies. We propose a formula to calculatescattered intensities (including both elastic and inelastic scattering) fromthe estimates obtained with a single-particle continuum model. We derive thisformula for systems under conditions typical for CDI studies with XFELs.

Effect of two-particle correlations on x-ray coherent diffractive imaging studies performed with continuum models