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The electrostatic contribution to twist rigidity of DNA is studied, and it isshown that the Coulomb self-energy of the double-helical sugar-phosphatebackbone contributes considerably to twist rigidity of DNA--the electrostatictwist rigidity of DNA is found as $C_{\rm elec}\approx 5$ nm, which makes upabout 7% of its total twist rigidity ($C_{\rm DNA}\approx 75$ nm). Theelectrostatic twist rigidity is found, however, to only weakly depend on thesalt concentration, because of a competition between two different screeningmechanisms: (1) Debye screening by the salt ions in the bulk, and (2)structural screening by the periodic charge distribution along the backbone ofthe helical polyelectrolyte. It is found that depending on the parameters, theelectrostatic contribution could stabilize or destabilize the structure of ahelical polyelectrolyte.Comment: 8 pages, 10 figures, uses RevTe

Electrostatic contribution to twist rigidity of DNA