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We have performed measurements of the IR absorption of $\text{SiO}_2$nanoparticles confined in an argon radio-frequency plasma discharge using anFTIR spectrometer. By varying the gas pressure of the discharge and duty cycleof the applied radio-frequency voltage we observed a shift of the absorptionpeak of $\text{SiO}_2$. We attributed this shift to charge-dependent absorptionfeatures of $\text{SiO}_2$. The charge-dependent shift has been calculated for$\text{SiO}_2$ particles and from comparisons with the experiment the particlecharge has been retrieved using our IRPRS (Infrared Phonon Resonance Shift)method. With the two different approaches of changing the gas pressure andaltering the duty cycle we are able to deduce a relative change of the particlecharge with pressure variations and an absolute estimate of the charge with theduty cycle.

Charge measurement of $\text{SiO}_2$ nanoparticles in an RF-plasma by IR absorption