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We propose a method to directly couple molecular dynamics, finite elementmethod and particle-in-cell techniques to simulate metal surface response tohigh electric fields. We use this method to simulate the evolution of a fieldemitting tip under thermal runaway by fully including the 3D space-chargeeffects. We also present a comparison of the runaway process between the twotip geometries of different widths. The results show with high statisticalsignificance that in case of sufficiently narrow field emitters, the thermalrunaway occurs in cycles where intensive neutral evaporation alternates withthe cooling periods. The comparison with previous works shows, that theevaporation rate in the regime of intensive evaporation is sufficient to ignitea plasma arc above the simulated field emitters.

Dynamic coupling between particle-in-cell and atomistic simulations