English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

Dual-phase xenon detectors, as currently used in direct detection dark matterexperiments, have observed elevated rates of background electron events in thelow energy region. While this background negatively impacts detectorperformance in various ways, its origins have only been partially studied. Inthis paper we report a systematic investigation of the electron pathologiesobserved in the LUX dark matter experiment. We characterize different electronpopulations based on their emission intensities and their correlations withpreceding energy depositions in the detector. By studying the background underdifferent experimental conditions, we identified the leading emissionmechanisms, including photoionization and the photoelectric effect induced bythe xenon luminescence, delayed emission of electrons trapped under the liquidsurface, capture and release of drifting electrons by impurities, and gridelectron emission. We discuss how these backgrounds can be mitigated in LUX andfuture xenon-based dark matter experiments.

Investigation of background electron emission in the LUX detector