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Heusler compounds are promising materials for spintronics with adjustableelectronic properties including 100% spin polarization at the Fermi energy. Weinvestigate the electronic states of AlOx capped epitaxial thin films of theferromagnetic half metal Co2MnSi ex-situ by soft X-ray angular resolvedphotoemission spectroscopy (SX-ARPES). Good agreement between the experimentalSX- ARPES results and photoemission calculations including surface effects wasobtained. In particular, we observed in line with our calculations a largephotoemission intensity at the center of the Brillouin zone, which does notoriginate from bulk states, but from a surface resonance. This provides strongevidence for the validity of the previously proposed model based on thisresonance, which was applied to explain the huge spin polarization of Co2MnSiobserved by angular-integrating UV-photoemission spectroscopy.

Surface resonance of the Heusler half metal Co2MnSi probed by SX-ARPES